Staff Profile

Biography

Dr. Liu received the BEng (Hons) degree in electronic engineering with first-class honors from The Hong Kong Polytechnic University, Hong Kong, in 2014, and the BEng degree in microelectronics from Sun Yat-sen University, Guangzhou, China, in the same year. He completed his PhD in electrical engineering at The Hong Kong Polytechnic University, Hong Kong, in 2019. Before joining Hong Kong Metropolitan University, Dr. Liu served as a postdoctoral researcher at the Institute of Textile and Clothing at The Hong Kong Polytechnic University. Subsequently, he worked as a research fellow at the Centre for Complexity and Complex Networks (CCCN) and the Department of Electrical Engineering at City University of Hong Kong. Dr. Liu is currently a full member of the IEEE Power and Energy Circuits and Systems Technical Committee and a member of the IEEE Power and Energy Society.

Teaching Areas & Research Interests

• Smart grids
• Cybersecurity
• Intelligent data analytics
• Complex networks

Selected Publications

Journal Articles

• D. Liu and C. K. Tse, "Cascading Failure of Cyber-Coupled Power Systems Considering Interactions Between Attack and Defense," in IEEE Transactions on Circuits and Systems I: Regular Papers, vol. 66, no. 11, pp. 4323-4336, Nov. 2019, doi: 10.1109/TCSI.2019.2922371.
• X. Zhang, D. Liu, H. Tu, and C. K. Tse, “An integrated modeling framework for cascading failure study and robustness assessment of cyber-coupled power grids,” Reliability Engineering & System Safety, vol. 226, p. 108654, Jun. 2022, doi: 10.1016/j.ress.2022.108654.
• J. Yang, C. K. Tse, M. Huang and D. Liu, "Bifurcations of Grid-Following Rectifiers and Routes to Voltage Instability in Weak AC Grids," in IEEE Transactions on Power Systems, vol. 38, no. 2, pp. 1702-1713, March 2023, doi: 10.1109/TPWRS.2022.3179287.
• X. Zhang et al., “Mitigating cascading failure in power grids with deep reinforcement learning-based remedial actions,” Reliability Engineering & System Safety, vol. 250, p. 110242, Jun. 2024, doi: 10.1016/j.ress.2024.110242.
• D. Liu, C. K. Tse, J. Yang and X. Zhang, "Revealing Cascading Failure Vulnerability in Evolving Power Grids With Increasing Penetration of Inverter-Based Resources," in IEEE Transactions on Circuits and Systems I: Regular Papers, vol. 72, no. 9, pp. 5192-5204, Sept. 2025, doi: 10.1109/TCSI.2024.3518112.

Further Information

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Modified Date: 29 Jan, 2026
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